Chenghui Jiang
at Tianjin Jinhang Institute of Technical Physics
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 8 July 2019
Proc. SPIE. 11064, Tenth International Conference on Thin Film Physics and Applications (TFPA 2019)
KEYWORDS: Thin films, Ellipsometry, Refractive index, Statistical analysis, Optical properties, Sputter deposition, Oxygen, Ion beams, Tantalum, Absorption

Proceedings Article | 12 December 2018
Proc. SPIE. 10847, Optical Precision Manufacturing, Testing, and Applications
KEYWORDS: Thin films, Optical filters, Refractive index, Sputter deposition, Manufacturing, Ion beams, Transmittance, Tantalum, Spectrophotometry, Bandpass filters

Proceedings Article | 21 August 2014
Proc. SPIE. 9283, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
KEYWORDS: Thin films, Ellipsometry, Refractive index, Spectrum analysis, Data modeling, Silica, Ion beams, Spectroscopic ellipsometry, Transmittance, Thin film deposition

Proceedings Article | 17 September 2013
Proc. SPIE. 8904, International Symposium on Photoelectronic Detection and Imaging 2013: High Power Lasers and Applications
KEYWORDS: Silica, Reflection, Calibration, Coating, Laser applications, Optical coatings, Reflectivity, Solid state lasers, Ion beams, Laser optics

Proceedings Article | 30 August 2013
Proc. SPIE. 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications
KEYWORDS: Thin films, Refractive index, FT-IR spectroscopy, Spectroscopy, Dielectrics, Silicon, Transmittance, Infrared radiation, Temperature metrology, Design for manufacturability

Showing 5 of 8 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top