Chenghui Jiang
at Tianjin Jinhang Institute of Technical Physics
SPIE Involvement:
Publications (8)

Proceedings Article | 8 July 2019 Paper
Proc. SPIE. 11064, Tenth International Conference on Thin Film Physics and Applications (TFPA 2019)
KEYWORDS: Oxygen, Tantalum, Thin films, Absorption, Refractive index, Sputter deposition, Ion beams, Ellipsometry, Optical properties, Statistical analysis

Proceedings Article | 12 December 2018 Paper
Proc. SPIE. 10847, Optical Precision Manufacturing, Testing, and Applications
KEYWORDS: Transmittance, Bandpass filters, Refractive index, Ion beams, Sputter deposition, Tantalum, Thin films, Optical filters, Manufacturing, Spectrophotometry

Proceedings Article | 21 August 2014 Paper
Proc. SPIE. 9283, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Micro- and Nano-Optical Devices and Systems
KEYWORDS: Transmittance, Thin films, Data modeling, Refractive index, Spectrum analysis, Ellipsometry, Spectroscopic ellipsometry, Thin film deposition, Silica, Ion beams

Proceedings Article | 17 September 2013 Paper
Proc. SPIE. 8904, International Symposium on Photoelectronic Detection and Imaging 2013: High Power Lasers and Applications
KEYWORDS: Coating, Reflection, Calibration, Laser optics, Optical coatings, Reflectivity, Silica, Ion beams, Solid state lasers, Laser applications

Proceedings Article | 30 August 2013 Paper
Proc. SPIE. 8910, International Symposium on Photoelectronic Detection and Imaging 2013: Imaging Spectrometer Technologies and Applications
KEYWORDS: Silicon, Temperature metrology, Refractive index, FT-IR spectroscopy, Thin films, Dielectrics, Infrared radiation, Transmittance, Design for manufacturability, Spectroscopy

Showing 5 of 8 publications
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