Dr. Dawid Kucharski
Research Fellow at Poznan Univ. of Technology
SPIE Involvement:
Author
Area of Expertise:
Metrology , Laser Optics , Measurement Systems , Interferometry , Quantum Metrology , Surface Metrology
Websites:
Publications (2)

SPIE Journal Paper | 25 January 2023
Dawid Kucharski, Maciej Obst, Jaroslaw Adamiec
OE, Vol. 62, Issue 01, 014106, (January 2023) https://doi.org/10.1117/12.10.1117/1.OE.62.1.014106
KEYWORDS: Polymers, Projection systems, Beam diameter, Optical engineering, Materials properties, Charge-coupled devices, Solids, Signal processing, Calibration, Shadows

SPIE Journal Paper | 1 October 2018
Frans Meijer, Dawid Kucharski, Ewa Stachowska
OE, Vol. 57, Issue 10, 104101, (October 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.10.104101
KEYWORDS: Mirrors, Fringe analysis, Sensors, Speckle, Optical engineering, Interferometers, Light sources, Speckle pattern, Michelson interferometers, Detection and tracking algorithms

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