Mr. David H. Parker
President at Parker Intellectual Property Enterprises, LLC
SPIE Involvement:
Senior status | Author
Area of Expertise:
Electrical Engineering , Physics , Intellectual Property
Profile Summary

Background in Electrical Engineering, Physics, Metrology, Research & Development, and Intellectual Property. Presently working in Intellectual Property as an Inventor and Patent Agent.
Publications (5)

PROCEEDINGS ARTICLE | August 24, 2017
Proc. SPIE. 10376, Novel Optical Systems Design and Optimization XX
KEYWORDS: Modulation, Wavefronts, Amplitude modulation, Optical components, Optical tracking, Interferometers, Retroreflectors, Ray tracing, Phase measurement, Heterodyning

PROCEEDINGS ARTICLE | April 19, 2017
Proc. SPIE. 10169, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure 2017
KEYWORDS: Nondestructive evaluation, 3D metrology, Distance measurement, 3D acquisition, Retroreflectors, Buildings, Structural health monitoring, Patents, Finite element methods, Bridges, Interferometers, Manufacturing

SPIE Journal Paper | July 1, 2006
OE Vol. 45 Issue 07
KEYWORDS: Retroreflectors, Distance measurement, Signal attenuation, Reflection, Glasses, Sensors, Phase shifts, Mirrors, Calibration, Solids

PROCEEDINGS ARTICLE | July 31, 1998
Proc. SPIE. 3357, Advanced Technology MMW, Radio, and Terahertz Telescopes
KEYWORDS: Telescopes, Servomechanisms, Metrology, Finite element methods, Antennas, Reflectors, Laser systems engineering, Laser metrology, Error analysis, Astronomy

SPIE Journal Paper | October 1, 1991
OE Vol. 30 Issue 10
KEYWORDS: Moire patterns, Spatial filters, Optical filters, Fourier transforms, Spatial frequencies, Solid state cameras, Image processing, Phase shifting, Visualization, Algorithm development

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