Mr. David H. Parker
President at Parker Intellectual Property Enterprises, LLC
SPIE Involvement:
Senior status | Author
Area of Expertise:
Electrical Engineering , Physics , Intellectual Property
Profile Summary

Background in Electrical Engineering, Physics, Metrology, Research & Development, and Intellectual Property. Presently working in Intellectual Property as an Inventor and Patent Agent.
Publications (5)

PROCEEDINGS ARTICLE | August 24, 2017
Proc. SPIE. 10376, Novel Optical Systems Design and Optimization XX
KEYWORDS: Optical components, Retroreflectors, Modulation, Interferometers, Wavefronts, Heterodyning, Ray tracing, Optical tracking, Phase measurement, Amplitude modulation

PROCEEDINGS ARTICLE | April 19, 2017
Proc. SPIE. 10169, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, and Civil Infrastructure 2017
KEYWORDS: Retroreflectors, Patents, 3D acquisition, Interferometers, Manufacturing, Nondestructive evaluation, Buildings, Distance measurement, Structural health monitoring, 3D metrology, Finite element methods, Bridges

SPIE Journal Paper | July 1, 2006
OE Vol. 45 Issue 07
KEYWORDS: Retroreflectors, Distance measurement, Signal attenuation, Reflection, Glasses, Sensors, Phase shifts, Mirrors, Calibration, Solids

PROCEEDINGS ARTICLE | July 31, 1998
Proc. SPIE. 3357, Advanced Technology MMW, Radio, and Terahertz Telescopes
KEYWORDS: Reflectors, Telescopes, Astronomy, Metrology, Error analysis, Finite element methods, Antennas, Servomechanisms, Laser metrology, Laser systems engineering

SPIE Journal Paper | October 1, 1991
OE Vol. 30 Issue 10
KEYWORDS: Moire patterns, Spatial filters, Optical filters, Fourier transforms, Spatial frequencies, Solid state cameras, Image processing, Phase shifting, Visualization, Algorithm development

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