Dr. Fei Yan
at State Key Lab of Pulse Power Laser Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 16, 2013
Proc. SPIE. 8796, 2nd International Symposium on Laser Interaction with Matter (LIMIS 2012)
KEYWORDS: Continuous wave operation, Sensors, Laser induced damage, Silicon, Semiconductor lasers, Thermal effects, Charge-coupled devices, Laser damage threshold, Pulsed laser operation, Temperature metrology

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