Prof. Guipeng Tie
at National Univ of Defense Technology
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | October 25, 2017
Proc. SPIE. 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics
KEYWORDS: Glasses, Manufacturing

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics
KEYWORDS: Magnetism, Profilometers

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10462, AOPC 2017: Optical Sensing and Imaging Technology and Applications
KEYWORDS: Electron beams, Transmittance, Infrared radiation, Spinel, Magnetorheological finishing, Beam analyzers

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Modeling, Prisms, Interferometers, Sensors, Calibration, Error analysis, Optical testing, Optical metrology, Distance measurement, Profilometers, Defense technologies, Motion measurement, Systems modeling, Standards development

PROCEEDINGS ARTICLE | October 25, 2016
Proc. SPIE. 9686, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices
KEYWORDS: Monochromatic aberrations, Mirrors, Ferroelectric materials, Electrodes, Crystals, Silicon, Adaptive optics, Deformable mirrors, Zernike polynomials, Retinal scanning

PROCEEDINGS ARTICLE | October 19, 2016
Proc. SPIE. 10154, Advanced Optical Design and Manufacturing Technology and Astronomical Telescopes and Instrumentation
KEYWORDS: Glasses, Surface roughness, Ion beams, Ion beam finishing

Showing 5 of 9 publications
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