Dr. Haiyang Quan
at Institute of Optics And Electronics CAS
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Optical components, Light sources, Light emitting diodes, Light emitting diodes, Defect detection, Imaging systems, Scattering, Scattering, Interferometers, Interferometers, Light scattering, Light scattering, Spherical lenses, Visibility, Visibility

Proceedings Article | 26 April 2019 Presentation + Paper
Proc. SPIE. 11032, EUV and X-ray Optics: Synergy between Laboratory and Space VI
KEYWORDS: X-ray optics, X-rays, Interferometry, Optical fabrication, Optical testing

Proceedings Article | 27 September 2016 Paper
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Data modeling, Optical testing, Inverse problems, Pixel resolution, Reconstruction algorithms, Spatial resolution, Optimization (mathematics), Iterative methods, Process modeling, Inverse optics

Proceedings Article | 27 September 2016 Paper
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Photovoltaics, Monochromatic aberrations, Statistical analysis, Optical spheres, Interferometers, Calibration, Interferometry, Wavefronts, Computer simulations, Optical testing

Proceedings Article | 8 October 2015 Paper
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Electronics, Metrology, Fluctuations and noise, Matrices, Interferometry, Optical testing, Reconstruction algorithms, Spatial resolution, Iterative methods, Direct methods

Showing 5 of 6 publications
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