Dr. Haiyang Quan
at Institute of Optics And Electronics CAS
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 18 November 2019
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Defect detection, Optical components, Spherical lenses, Imaging systems, Light sources, Light scattering, Light scattering, Light emitting diodes, Light emitting diodes, Scattering, Scattering, Interferometers, Interferometers, Visibility, Visibility

Proceedings Article | 26 April 2019
Proc. SPIE. 11032, EUV and X-ray Optics: Synergy between Laboratory and Space VI
KEYWORDS: Interferometry, X-rays, Optical testing, X-ray optics, Optical fabrication

Proceedings Article | 27 September 2016
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Optimization (mathematics), Reconstruction algorithms, Iterative methods, Process modeling, Inverse problems, Optical testing, Pixel resolution, Data modeling, Inverse optics, Spatial resolution

Proceedings Article | 27 September 2016
Proc. SPIE. 9684, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
KEYWORDS: Interferometry, Computer simulations, Calibration, Photovoltaics, Monochromatic aberrations, Interferometers, Statistical analysis, Wavefronts, Optical spheres, Optical testing

Proceedings Article | 8 October 2015
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Spatial resolution, Reconstruction algorithms, Optical testing, Iterative methods, Metrology, Interferometry, Matrices, Direct methods, Fluctuations and noise, Electronics

Showing 5 of 6 publications
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