Bingtian Jia
at Tianjin University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 August 2015
Proc. SPIE. 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Mathematical modeling, Sensors, Calibration, Error analysis, Laser development, Head, Precision measurement, Distance measurement, Mathematics, Laser beam diagnostics

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