To improve the spatial resolution of X-ray imaging systems, optical micro-scanning technology was taken into the existing system and the optical micro-scanning X-ray imaging systems is obtained. We can get a low-resolution X-ray image sequence by this system and then reconstruct high-resolution X-ray image. The inaccurate estimates of registration parameters, the inaccurate estimates of the point spread function and the additive Gaussian noise in the lowresolution (LR) image sequence will result in different noise level for each frame and influence the effects of reconstruction. This paper proposed an image super-resolution algorithm for different error levels Per frame, the LR frames are adaptively weighted according to their reliability and the regularization parameter. And then we complete the super-resolution reconstruction. The simulation and experiment results shows the effectiveness of the proposed algorithm.
With optical micro-scanning technology, the spatial resolution of the thermal microscope imaging system can be increased without reducing the size of the detector unit or increasing the detector dimensions. Due to optical micro-scanning error, the four low-resolution images collected by micro-scanning thermal micro- scope imaging system are not standard down-sampled images. The reconstructed image quality is degraded by the direct image interpolation with error, which influences the performance of the system. Therefore, the technique to reduce the system micro-scanning error need to be studied. Based on micro-scanning technology and combined with new edge directed interpolation(NEDI) algorithm, an error correction technique for the micro-scanning instrument is proposed. Simulations and experiments show that the proposed technique can reduce the optical micro-scanning error, improve the imaging effect of the system and improve the systems spatial resolution. It can be applied to other electro-optical imaging systems to improve their resolution.
To improve the spatial resolution of the thermal microscope imaging system, the micro-scanning zero point should be determined. Based on geometric principles, a new technique for zero calibration by using an image registration algorithm is presented. The aim of the technique is to obtain the size and direction of the zero calibration angles by estimating the displacement between two thermal microscope images. The simulations and experiments are conducted separately before and after the zero calibration is determined. Our main results show that the proposed technique can effectively improve the thermal microscope imaging quality. Furthermore this technique can also be applied to other electro-optical imaging systems and improve their resolutions.