Prof. Jigui Zhu
at Tianjin Univ
SPIE Involvement:
Author | Editor
Publications (29)

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Aerospace engineering, Imaging systems, Cameras, Calibration, Matrices, Reliability, Zinc, Control systems, Navigation systems, 3D metrology

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Beam splitters, Retroreflectors, Femtosecond phenomena, Interferometers, Calibration, Fourier transforms, Interferometry, Distance measurement, Pulsed laser operation, Camera shutters

Proceedings Article | 12 March 2020 Paper
Proc. SPIE. 11439, 2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Transmitters, Manufacturing, Receivers, Signal processing, Distributed computing

SPIE Journal Paper | 26 April 2018
OE Vol. 57 Issue 04
KEYWORDS: Transmitters, Receivers, Autocollimators, Prisms, Head, Error analysis, Optical engineering, Computing systems, Fluctuations and noise, Data modeling

Proceedings Article | 12 January 2018 Paper
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Interferometers, LIDAR, Distance measurement, Ranging, Femtosecond frequency combs

Showing 5 of 29 publications
Proceedings Volume Editor (4)

Conference Committee Involvement (4)
International Conference on Optical Instruments and Technology 2019: Optoelectronic Measurement Technology and Systems
26 October 2019 | Beijing, China
International Conference on Optical Instruments and Technology 2017: Optoelectronic Measurement Technology and System
28 October 2017 | Beijing, China
2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
8 May 2015 | Beijing, China
Optoelectronic Measurement Technology and Systems
17 November 2013 | Beijing, China
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top