Miss Jingjing Fan
researcher at Changcheng Institute of Metrology & Measurement
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Metrology, Opto mechatronics, Calibration, Data storage, Manufacturing, Inspection, Clouds, Laser scanners

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