Ms. Jingjing Fan
researcher at Beihang Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Metrology, Opto mechatronics, Calibration, Data storage, Manufacturing, Inspection, Clouds, Laser scanners

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top