Miss Jingjing Fan
researcher at Changcheng Institute of Metrology & Measurement
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Inspection, Clouds, Manufacturing, Opto mechatronics, Metrology, Laser scanners, Data storage, Calibration

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top