Dr. Junchao Zhang
at National Institute of Metrology
SPIE Involvement:
Author
Publications (12)

PROCEEDINGS ARTICLE | November 8, 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Calibration, Solar cells, Xenon, Halogens, Multijunction solar cells, Standards development

PROCEEDINGS ARTICLE | November 7, 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Mirrors, Light sources, Calibration, Error analysis, Mercury, Lamps, Fourier transforms, Neon, Monochromators, Light

PROCEEDINGS ARTICLE | November 5, 2018
Proc. SPIE. 10814, Optoelectronic Devices and Integration VII
KEYWORDS: Photovoltaics, Light sources, Metrology, Calibration, Solar cells, Computer simulations, Diodes, Transmittance, Laser optics, Standards development

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Light sources, Metrology, Sensors, Calibration, Silicon, Quantum efficiency, Radiometry, Standards development

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Photovoltaics, Metrology, Einsteinium, Calibration, Solar cells, Capacitance, Transmittance, Analytical research, Laser optics, Temperature metrology

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10460, AOPC 2017: Optoelectronics and Micro/Nano-Optics
KEYWORDS: Infrared cameras, Calibration

Showing 5 of 12 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top