Zhen-zhen Li
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8418, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Design, Manufacturing, and Testing of Smart Structures, Micro- and Nano-Optical Devices, and Systems
KEYWORDS: Signal to noise ratio, Edge detection, Electronics, Stars, Image processing, Denoising, Interference (communication), Star sensors, Image filtering, Image denoising

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