Prof. Liqun Ma
director at Changcheng Institute of Measurement & Metrology
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Mathematical modeling, Imaging systems, Cameras, Data storage, Digital cameras, Optoelectronics, Connectors, Image storage, Dynamical systems, Camera shutters

PROCEEDINGS ARTICLE | September 19, 2017
Proc. SPIE. 10396, Applications of Digital Image Processing XL
KEYWORDS: Statistical analysis, Detection and tracking algorithms, Metals, Image segmentation, Image processing, Corrosion, Feature extraction, Color image processing, Analytical research, RGB color model

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Metrology, Opto mechatronics, Calibration, Data storage, Manufacturing, Inspection, Clouds, Laser scanners

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Metrology, Imaging systems, Cameras, Sensors, Calibration, Error analysis, Distortion, CCD cameras, Photogrammetry, Stereo vision systems

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Calibration, Reliability, Chromium, Control systems, Computer programming, Data processing, Telecommunications, Software development, Photonic integrated circuits, Data communications

PROCEEDINGS ARTICLE | January 31, 2013
Proc. SPIE. 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Transmitters, MATLAB, Metrology, Lithium, Sensors, Calibration, Error analysis, Receivers, Uncertainty analysis, Global Positioning System

Showing 5 of 6 publications
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