Longlong Wang
at NIM
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 10, 2013
Proc. SPIE. 8916, Sixth International Symposium on Precision Mechanical Measurements
KEYWORDS: Sensors, Calibration, Electrodes, Amplifiers, Atomic force microscopy, Capacitance, Finite element methods, Signal analysis, Atomic force microscope, Feedback signals

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