Mengyang Zou
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 September 2016 Paper
Proceedings Volume 9927, 99271Q (2016) https://doi.org/10.1117/12.2238491
KEYWORDS: Thin films, Oxygen, Vanadium, Crystals, Semiconductors, Temperature metrology, Ions, Silicon films, Resistance, Photonics

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