Mengyuan Li
at Univ of Shanghai for Science and Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Reflectors, Light emitting diodes, Reflectivity, Computer simulations, LED backlight, Structural design, Luminous efficiency, Systems modeling, Device simulation, Instrument modeling

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