Dr. Nian Yan
at Tianjin Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 24, 2014
Proc. SPIE. 9301, International Symposium on Optoelectronic Technology and Application 2014: Image Processing and Pattern Recognition
KEYWORDS: Signal to noise ratio, Detection and tracking algorithms, Data modeling, Cameras, Sensors, Calibration, 3D modeling, Image registration, Coded apertures, Expectation maximization algorithms

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