Mr. Ke-cheng Pan
at Zhejiang Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8420, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical System Technologies for Manufacturing and Testing
KEYWORDS: Image compression, Visualization, Image processing, Remote sensing, Diffusion, Computer programming, Computer simulations, Color difference, Panoramic photography, RGB color model

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