Dr. Qi Li
at National Institute of Metrology
SPIE Involvement:
Author
Publications (12)

PROCEEDINGS ARTICLE | November 15, 2017
Proc. SPIE. 10605, LIDAR Imaging Detection and Target Recognition 2017

PROCEEDINGS ARTICLE | January 5, 2017
Proc. SPIE. 10244, International Conference on Optoelectronics and Microelectronics Technology and Application

PROCEEDINGS ARTICLE | October 19, 2016
Proc. SPIE. 10155, Optical Measurement Technology and Instrumentation
KEYWORDS: Atomic force microscope

PROCEEDINGS ARTICLE | January 26, 2016
Proc. SPIE. 9903, Seventh International Symposium on Precision Mechanical Measurements
KEYWORDS: Actuators, Optical components, Microscopes, Ferroelectric materials, Metrology, Deep ultraviolet, Interferometers, Calibration, Scanning electron microscopy, Photomasks

PROCEEDINGS ARTICLE | November 5, 2015
Proc. SPIE. 9795, Selected Papers of the Photoelectronic Technology Committee Conferences held June–July 2015
KEYWORDS: Human-machine interfaces, Metrology, LabVIEW, Interferometers, Ceramics, Interfaces, Control systems, Data acquisition, Signal generators, Control systems design

PROCEEDINGS ARTICLE | March 6, 2015
Proc. SPIE. 9446, Ninth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Metrology, Optical spheres, X-ray computed tomography, Sensors, Calibration, X-rays, X-ray sources, 3D metrology, Printed circuit board testing, Standards development

Showing 5 of 12 publications
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