Sean Archer
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 21, 2015
Proc. SPIE. 9472, Algorithms and Technologies for Multispectral, Hyperspectral, and Ultraspectral Imagery XXI
KEYWORDS: Contamination, Data modeling, Sensors, Bidirectional reflectance transmission function, Digital imaging, Infrared radiation, Aluminum, Statistical modeling, Thermal modeling, Temperature metrology

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