Dr. Sepehr Razi
at Urmia Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Femtosecond phenomena, Scattering, Cameras, Light scattering, Laser scattering, Reflectivity, Atomic force microscopy, Optical testing, Scanning electron microscopy, Process control, Direct methods, Power meters, Scanning tunneling microscopy, Laser systems engineering

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