Stacy Kamasz
Engineer at Stacy's Tech Publications
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 15 May 2001 Paper
S. Gareth Ingram, Queintin Tang, Stacy Kamasz, Martin Kiik, Don Dattani, Douglas Dykaar, Andrei Pavlov, Gary Allan, Eric Fox, Binqiao Li
Proceedings Volume 4306, (2001) https://doi.org/10.1117/12.426947
KEYWORDS: Sensors, CMOS sensors, Camera shutters, Amplifiers, Image sensors, Transistors, Multiplexers, Interference (communication), Analog electronics, Field effect transistors

Proceedings Article | 15 May 2000 Paper
Stacy Kamasz, Thomas Graen, Nixon O, Wolfgang Steinbach, Brian Benwell
Proceedings Volume 3965, (2000) https://doi.org/10.1117/12.385469
KEYWORDS: Sensors, CCD image sensors, Charge-coupled devices, Line scan image sensors, Video, Signal to noise ratio, Image resolution, Imaging systems, Image sensors, Electrons

Proceedings Article | 10 April 1995 Paper
M. Agwani, Stacy Kamasz
Proceedings Volume 2415, (1995) https://doi.org/10.1117/12.206534
KEYWORDS: Charge-coupled devices, Sensors, Amplifiers, Metals, Clocks, Diffusion, Doping, Pulsed laser operation, CCD image sensors, Line scan image sensors

Proceedings Article | 1 May 1994 Paper
Robert Sabila, Michael Farrier, Stacy Kamasz, Savvas Chamberlain, Shing-Fat Ma
Proceedings Volume 2172, (1994) https://doi.org/10.1117/12.172766
KEYWORDS: Clocks, Metals, Sensors, Image sensors, CCD image sensors, Resistance, Image segmentation, Capacitance, Sensor technology, Reconnaissance

Proceedings Article | 1 May 1994 Paper
Michael Farrier, Stacy Kamasz, Charles Smith
Proceedings Volume 2172, (1994) https://doi.org/10.1117/12.172768
KEYWORDS: Charge-coupled devices, Photons, Silicon, Near infrared, Imaging systems, Visible radiation, X-rays, Electrons, Semiconducting wafers, X-ray imaging

Showing 5 of 12 publications
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