Dr. Volodymyr V. Skliarov
Scientific Secretary at National Scientific Ctr Institute of Metrology
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 23 April 2020 Presentation + Paper
Proc. SPIE. 11379, Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2020
KEYWORDS: Metrology, Numerical simulations, 3D modeling, Velocity measurements, Aerodynamics

Proceedings Article | 22 April 2020 Presentation + Paper
Proc. SPIE. 11380, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XIV
KEYWORDS: Microelectromechanical systems, Metrology, Safety, Sensors, Diagnostics, Nondestructive evaluation, Vibration control, Structural engineering

Proceedings Article | 26 March 2019 Paper
Proc. SPIE. 10959, Metrology, Inspection, and Process Control for Microlithography XXXIII
KEYWORDS: Metrology, Reliability, Numerical analysis, Thermal effects, Finite element methods, Software engineering, Standards development, Temperature metrology

Proceedings Article | 26 March 2019 Paper
Proc. SPIE. 10959, Metrology, Inspection, and Process Control for Microlithography XXXIII
KEYWORDS: Mathematical modeling, Metrology, Metals, Finite element methods, Analytical research, Tolerancing, Process modeling, Standards development

Proceedings Article | 27 March 2018 Paper
Proc. SPIE. 10602, Smart Structures and NDE for Industry 4.0
KEYWORDS: Metrology, Calibration, Laser energy, Nickel, 3D modeling, Additive manufacturing, Temperature sensors, Chemical elements, Standards development, Temperature metrology

Showing 5 of 9 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top