Wan Xu
at Oakland University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 January 2016
Proc. SPIE. 9903, Seventh International Symposium on Precision Mechanical Measurements
KEYWORDS: Safety, Speckle, Cameras, Calibration, Image processing, In situ metrology, CCD cameras, Digital image correlation, Mechanical engineering, Strain analysis

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