Dr. Yanqing Wang
at Beihang Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 31, 2013
Proc. SPIE. 8759, Eighth International Symposium on Precision Engineering Measurement and Instrumentation
KEYWORDS: Statistical analysis, Data modeling, Reliability, Optoelectronics, Data processing, Ytterbium, Tolerancing, Probability theory, Environmental sensing, Data analysis

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