Dr. WeiDong Gao
at Institute of Optics and Electronics CAS
SPIE Involvement:
Publications (9)

Proceedings Article | 13 October 2010 Paper
Weidong Gao, Yinhua Zhang, Hongxiang Liu
Proceedings Volume 7656, 76566T (2010) https://doi.org/10.1117/12.865979
KEYWORDS: Refractive index, Data modeling, Thermal modeling, Oxides, Surface roughness, Hafnium, Spectroscopic ellipsometry, Dispersion, Absorption, Interfaces

Proceedings Article | 20 May 2009 Paper
Proceedings Volume 7283, 72832L (2009) https://doi.org/10.1117/12.828718
KEYWORDS: Silicon, Thin films, Spectroscopic ellipsometry, Refractive index, Silicon films, Oscillators, Zinc, Far infrared, Surface roughness, Crystals

Proceedings Article | 26 January 2005 Paper
Proceedings Volume 5627, (2005) https://doi.org/10.1117/12.570313
KEYWORDS: Laser induced damage, Modes of laser operation, Silicon, Semiconductor lasers, Nd:YAG lasers, Absorption, Laser damage threshold, Surface finishing, Optical components, Thermal modeling

Proceedings Article | 10 January 2005 Paper
Proceedings Volume 5623, (2005) https://doi.org/10.1117/12.571035
KEYWORDS: Chemical species, Refractive index, Molecules, Ions, Ion beams, Electron beams, Thin films, Crystals, Reflectivity, Zirconium

Proceedings Article | 8 December 2004 Paper
Yuanan Zhao, Jianda Shao, Tao Wang, Dongping Zhang, Shuhai Fan, Jianbing Huang, WeiDong Gao, Zhengxiu Fan
Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607903
KEYWORDS: Laser induced damage, Absorbance, Raster graphics, Mirrors, Dielectrics, Optical coatings, Dielectric mirrors, Laser stabilization, Oxides, Thin film coatings

Showing 5 of 9 publications
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