Dr. WeiDong Gao
at Institute of Optics and Electronics CAS
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 13 October 2010 Paper
Proc. SPIE. 7656, 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Oxides, Refractive index, Data modeling, Dispersion, Interfaces, Surface roughness, Spectroscopic ellipsometry, Hafnium, Thermal modeling, Absorption

Proceedings Article | 20 May 2009 Paper
Proc. SPIE. 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Thin films, Refractive index, Oscillators, Crystals, Silicon, Surface roughness, Zinc, Silicon films, Spectroscopic ellipsometry, Far infrared

Proceedings Article | 26 January 2005 Paper
Proc. SPIE. 5627, High-Power Lasers and Applications III
KEYWORDS: Optical components, Laser induced damage, Silicon, Nd:YAG lasers, Semiconductor lasers, Laser damage threshold, Modes of laser operation, Thermal modeling, Surface finishing, Absorption

Proceedings Article | 10 January 2005 Paper
Proc. SPIE. 5623, Passive Components and Fiber-based Devices
KEYWORDS: Thin films, Refractive index, Electron beams, Chemical species, Molecules, Crystals, Ions, Reflectivity, Ion beams, Zirconium

Proceedings Article | 8 December 2004 Paper
Proc. SPIE. 5774, Fifth International Conference on Thin Film Physics and Applications
KEYWORDS: Oxides, Mirrors, Laser induced damage, Dielectrics, Optical coatings, Laser stabilization, Absorbance, Raster graphics, Thin film coatings, Dielectric mirrors

Showing 5 of 9 publications
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