A new method of FOV quality test of the anti ion feedback microchannel plate was introduced, Ultraviolet Photoelectric Method, and the principle and the structure of the device were given. The test principle and device structure are given. The problems in the testing, including the mutual relationship between the UV transmittance and the quantum efficiency of the Au cathode, and the influence of the photoelectrons on the field of view caused by the UV-excited MCP were discussed. The advantages of the UV photoelectron method in the field defect detection were compared. Which provided a basis for the application of Ultraviolet Photoelectric Method and proves the research direction.