Dr. Xing Chen
at Shanghai Institute of Technical Physics CAS
SPIE Involvement:
Publications (3)

PROCEEDINGS ARTICLE | October 15, 2015
Proc. SPIE. 9674, AOPC 2015: Optical and Optoelectronic Sensing and Imaging Technology
KEYWORDS: Readout integrated circuits, Infrared detectors, Thermography, Infrared imaging, Sensors, Indium, Reliability, Infrared radiation, Infrared technology, Failure analysis

PROCEEDINGS ARTICLE | September 11, 2013
Proc. SPIE. 8907, International Symposium on Photoelectronic Detection and Imaging 2013: Infrared Imaging and Applications
KEYWORDS: Staring arrays, Infrared detectors, Infrared sensors, Mercury cadmium telluride, Sensors, Reliability, Finite element methods, Cryogenics, Temperature metrology, Lead

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8419, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Sensing, Imaging, and Solar Energy
KEYWORDS: Staring arrays, Thermography, Mercury cadmium telluride, Sensors, Gallium arsenide, Sapphire, Finite element methods, Infrared radiation, Stress analysis, Lead

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