Dr. Xingting Xiong
at Tianjin Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Radar, Metrology, Continuous wave operation, Modulation, Doppler effect, Interferometers, Distance measurement, 3D metrology, Phase measurement, Laser metrology

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