Yan Zhao
at Tianjin Univ
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Lithium, Calibration, Error analysis, Inspection, Optical simulations, Instrument modeling

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Sensors, Calibration, Particle swarm optimization

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Mathematical modeling, Error analysis, Composites, Manufacturing, 3D modeling, Optoelectronics, Distance measurement, Instrumentation engineering, Tolerancing, Standards development

PROCEEDINGS ARTICLE | January 12, 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Metrology, Optical spheres, Interferometers, Cameras, Sensors, Video, Error analysis, Inspection

PROCEEDINGS ARTICLE | December 19, 2013
Proc. SPIE. 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
KEYWORDS: Fringe analysis, Data modeling, Visualization, Surgery, Imaging systems, Computer simulations, 3D modeling, Computer graphics, Solid modeling, 3D image processing

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