Yichao Liang
at Nanjing Univ of Science and Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Imaging systems, Lenses, Cameras, Calibration, Distortion, 3D modeling, 3D metrology, Projection systems, Reconstruction algorithms, Algorithm development

Proceedings Article | 16 October 2019 Paper
Proc. SPIE. 11205, Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)

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