Ying Cai
at Unit 92493 of PLA
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 January 2016
Proc. SPIE. 9796, Selected Papers of the Photoelectronic Technology Committee Conferences held November 2015
KEYWORDS: Metrology, Calibration, Resistance, Magnetism, Amplifiers, Power supplies, Control systems, Electronic components, Particle filters, Signal detection

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