Mr. Yongjia Xu
at Hebei Univ of Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 19, 2013
Proc. SPIE. 9046, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Fringe analysis, Cameras, Composites, Fourier transforms, CCD cameras, Heterodyning, 3D metrology, Projection systems, Digital micromirror devices, Digital Light Processing

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