Dr. Yoshihisa Murakami Profile

Dr. Yoshihisa Murakami

at Tsukuba Univ of Technology

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 16 March 2015 Paper

Paper

Application of photo-doping phenomenon in amorphous chalcogenide GeS2 film to optical device

Yoshihisa Murakami, Katsuya Arai, Moriaki Wakaki, Takehisa Shibuya, Toshihiro Shintaku

Proceedings Volume 9359, 93591N (2015) https://doi.org/10.1117/12.2078142

KEYWORDS: Silver, Waveguides, Diffraction, Chalcogenides, Diffraction gratings, Optical components, Metals, Doping, Holography, Helium neon lasers

Read Abstract +

Proceedings Article | 7 March 2014 Paper

Paper

Quantitative characterization of photodoping phenomena in amorphous chalcogenide GeS2 film

Yoshihisa Murakami, Moriaki Wakaki

Proceedings Volume 8982, 898217 (2014) https://doi.org/10.1117/12.2038390

KEYWORDS: Doping, Silver, Metals, Quantum efficiency, Chalcogenides, Thermal effects, Diffusion, Transmittance, Semiconductor lasers, Absorption

Read Abstract +

Proceedings Article | 23 February 2011 Paper

Paper

Study on photodoping properties for the multilayered films GeS2/Ag/GeS2 and Ag/GeS2/Ag

Yoshihisa Murakami, Takahiro Iijima, Moriaki Wakaki

Proceedings Volume 7934, 793412 (2011) https://doi.org/10.1117/12.873269

KEYWORDS: Doping, Silver, Metals, Multilayers, Laser irradiation, Diffusion, Transmittance, Chalcogenides, Chalcogenide glass, Interfaces

Read Abstract +

Proceedings Article | 14 February 2011 Paper

Paper

Laser processing and monitoring of Ag photodoped patterns in GeS2 amorphous films by dual functional laser scanning micro-processing/micro-scope system utilizing UV/VIS confocal laser scanning microscope

Yoshikazu Kanai, Yoshihisa Murakami, Moriaki Wakaki, Norihide Takeyama

Proceedings Volume 7927, 792714 (2011) https://doi.org/10.1117/12.874310

KEYWORDS: Silver, Laser scanners, Doping, Diffraction, Laser systems engineering, Diffraction gratings, Ultraviolet radiation, Microscopes, Laser processing, Geometrical optics

Read Abstract +

SIGN IN TO:

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Advertisement

Advertisement