Yudan Wang
at Xi’an Institute of Optics and Precision Mechanics
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10462, AOPC 2017: Optical Sensing and Imaging Technology and Applications
KEYWORDS: Defect detection, Inspection, Fourier transforms, Feature extraction

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top