Yunlin Zhang
at National Institute of Metrology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 October 2015
Proc. SPIE. 9677, AOPC 2015: Optical Test, Measurement, and Equipment
KEYWORDS: Diffraction, Refractive index, Fabry–Perot interferometers, Interferometers, Carbon dioxide lasers, Humidity, Laser stabilization, Environmental sensing, Temperature metrology, Diffraction gratings

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