3D measurements using a programmable projector and a grating

Kevin Harding; Russ Demuth; Robert Tait

doi:10.1117/12.630083

7 November 2005 3D measurements using a programmable projector and a grating

Kevin Harding, Russ Demuth, Robert Tait

Proceedings Volume 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III; 60000C (2005) https://doi.org/10.1117/12.630083
Event: Optics East 2005, 2005, Boston, MA, United States

Abstract

Pattern projection using physical gratings or interference effects has successfully been used to perform 3D measurements of parts. However, such systems lack the flexibility to adjust light levels over the area illuminated, leaving some areas too dark or too light to measure, or the ability to mask out parts of the illumination field, often creating spurious reflections and noise from areas not of interest. LCD/DMD digital projection systems have been used to create flexible projection of patterns, but they are limited in their resolution and ability to accurately reconstruct a smooth light pattern such as a sine wave, creating more a binarized approximation. This paper describes a method that combines together a computer-interfaced projector, such as an LCD or DMD based projector, with a high-resolution pattern projection system. The result is a system that has high depth resolution, but with the added flexibility of a programmable light source to control light levels and areas of illumination. This paper will discuss the pros and cons of this method, and suggest ways this approach might be applied to difficult part measurement problems.

Citation Download Citation

Kevin Harding, Russ Demuth, and Robert Tait "3D measurements using a programmable projector and a grating", Proc. SPIE 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III, 60000C (7 November 2005); https://doi.org/10.1117/12.630083

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