Dr. Jeff Hosea Profile

Dr. Jeff Hosea

Senior Lecturer at Univ of Surrey

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Author

Publications (4)

Proceedings Article | 11 September 2010 Paper

Mid-infrared GaInSb quantum well laser structures: a comparison of their characterisation using photoluminescence, photo-modulated reflectance, and FTIR-based surface photovoltage spectroscopies

Natasha Fox, A. Andreev, G. Nash, T. Ashley, T. J. Hosea

Proceedings Volume 7755, 77550C (2010) https://doi.org/10.1117/12.861159

KEYWORDS: Quantum wells, Surface plasmons, Reflectivity, Luminescence, FT-IR spectroscopy, Mid-IR, Spectroscopy, Modulation, Gallium arsenide, Quantum cascade lasers

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Proceedings Article | 21 June 2004 Paper

Reflectivity fitting for accurate thickness and compositional determination in RCLEDs

Terry Sale, Konstanze Hild, T. Hosea, Masumi Hirotani, Y. Kato

Proceedings Volume 5366, (2004) https://doi.org/10.1117/12.529654

KEYWORDS: Aluminum, Reflectivity, Scanning electron microscopy, Semiconducting wafers, Mirrors, Vertical cavity surface emitting lasers, Gallium, Aluminium gallium indium phosphide, Calibration, Light emitting diodes

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Proceedings Article | 12 May 2004 Paper

Advances in the spectroscopic characterization of vertical-cavity optoelectronic devices and structures using modulated reflectance

Thomas Hosea

Proceedings Volume 5280, (2004) https://doi.org/10.1117/12.519965

KEYWORDS: Quantum wells, Curium, Vertical cavity surface emitting lasers, Modulation, Reflectivity, Semiconducting wafers, Reflectance spectroscopy, Wafer-level optics, Light emitting diodes, Optical microcavities

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Proceedings Article | 1 May 2000 Paper

Development of a red VCSEL-to-plastic fiber module for use in parallel optical data links

John Lambkin, T. Calvert, Brian Corbett, Jon Woodhead, Steven Pinches, Alexander Onischenko, Terry Sale, Jeff Hosea, Peter Van Daele, Koen Van de Putte, An Van Hove, Adriaan Valster, John McInerney, Pierpaolo Porta

Proceedings Volume 3946, (2000) https://doi.org/10.1117/12.384366

KEYWORDS: Vertical cavity surface emitting lasers, Phase only filters, Oxides, Absorption, Internal quantum efficiency, Semiconducting wafers, Thermal modeling, Optical alignment, Thermal effects, Oxidation

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