Paper
1 January 1983 Dynamic Study Of Amorphous Tb-Fe Film For Magneto-Optic Memory Application
Tu Chen, David Troves
Author Affiliations +
Proceedings Volume 0382, Optical Data Storage; (1983) https://doi.org/10.1117/12.970213
Event: Optical Data Storage, 1983, Incline Village, United States
Abstract
Magneto-optic (M-O) enhancement and dynamic recording characteristics of amorphous Tb-Fe thin film media were investigated for a bilayer and a quadrilayer structure. The results of the investigations on the M-O enhancement, using a static tester, show that an optimum M-O response in a bilayer structure media occurs at a TbFe film thickness of 20 nm, whereas for the quadrilayer, the optimum response occurs between 30 and 40 nm, depending on the thickness of intermediate SiO used. Comparison of the maximum M-O response in the two film structures shows that an increase in signal-to-noise ratio (S/N) up to 2dB can be achieved by using the quadrilayer structure. A saturation peak to peak signal to rms noise of up to 35 and 37 dB were measured respectively, for the bilayer and the quadrilayer films using the dynamic tester.
© (1983) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tu Chen and David Troves "Dynamic Study Of Amorphous Tb-Fe Film For Magneto-Optic Memory Application", Proc. SPIE 0382, Optical Data Storage, (1 January 1983); https://doi.org/10.1117/12.970213
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Cited by 2 scholarly publications.
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KEYWORDS
Dielectrics

Reflectivity

Aluminum

Thin films

Signal to noise ratio

Terbium

Magneto-optics

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