Surface Relief of Mapping

Manuel F.M. Costa; Jose B. Almeida

doi:10.1117/12.949251

15 February 1989 Surface Relief of Mapping

Manuel F.M. Costa, Jose B. Almeida

Proceedings Volume 1010, Industrial Inspection; (1989) https://doi.org/10.1117/12.949251
Event: 1988 International Congress on Optical Science and Engineering, 1988, Hamburg, Germany

Abstract

We will describe in this communication a noncont act method of measuring surface profile, it does not require any surface preparation, and it can be used with a very large range of surfaces from highly reflecting to non reflecting ones and as complex as textile surfaces. This method is reasonably immune to dispersion and diffraction, which usually make very difficult the application of non contact profilometry methods to a wide range of materials and situations, namely on quality control systems in industrial production lines. The method is based on the horizontal shift of the bright spot on a horizontal surface when this is illuminated with an oblique beam and moved vertically. in order to make the profilometry the sample is swept by an oblique light beam and the bright spot position is compared with a reference position. The bright spot must be as small as possible, particularly in very irregular surfaces; so the light beam diameter must be as small as possible and the incidence angle must not be too small. The sensivity of a system based on this method will be given, mostly, by the reception optical system.

Citation Download Citation

Manuel F.M. Costa and Jose B. Almeida "Surface Relief of Mapping", Proc. SPIE 1010, Industrial Inspection, (15 February 1989); https://doi.org/10.1117/12.949251

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