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21 June 2017 Investigating radiation induced damage processes with femtosecond x-ray pulses (Conference Presentation)
Changyong Song
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Proceedings Volume 10236, Damage to VUV, EUV, and X-ray Optics VI; 102360B (2017) https://doi.org/10.1117/12.2270685
Event: SPIE Optics + Optoelectronics, 2017, Prague, Czech Republic
Abstract
Interest in high-resolution structure investigation has been zealous, especially with the advent of X-ray free electron lasers (XFELs). The intense and ultra-short X-ray laser pulses (~ 10 GW) pave new routes to explore structures and dynamics of single macromolecules, functional nanomaterials and complex electronic materials. In the last several years, we have developed XFEL single-shot diffraction imaging by probing ultrafast phase changes directly. Pump-probe single-shot imaging was realized by synchronizing femtosecond (<10 fs in FWHM) X-ray laser (probe) with femtosecond (50 fs) IR laser (pump) at better than 1 ps resolution. Nanoparticles under intense fs-laser pulses were investigated with fs XFEL pulses to provide insight into the irreversible particle damage processes with nanoscale resolution. Research effort, introduced, aims to extend the current spatio-temporal resolution beyond the present limit. We expect this single-shot dynamic imaging to open new science opportunity with XFELs.
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Changyong Song "Investigating radiation induced damage processes with femtosecond x-ray pulses (Conference Presentation)", Proc. SPIE 10236, Damage to VUV, EUV, and X-ray Optics VI, 102360B (21 June 2017); https://doi.org/10.1117/12.2270685
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KEYWORDS
Femtosecond phenomena
X-ray lasers
X-rays
Ultrafast imaging
Diffraction
Free electron lasers
Infrared lasers
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