UV focal plane array device relative spectral response measurement technology research

HongYuan Liu; ChengPing Ying; Hongchao Wang; Hengfei Wang; Xueshun Shi; Bin Wu; Bin Jiang

doi:10.1117/12.2267422

8 March 2017 UV focal plane array device relative spectral response measurement technology research

HongYuan Liu, ChengPing Ying, Hongchao Wang, Hengfei Wang, Xueshun Shi, Bin Wu, Bin Jiang

Proceedings Volume 10255, Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016; 102553E (2017) https://doi.org/10.1117/12.2267422
Event: Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016, 2016, Jinhua, Suzhou, Chengdu, Xi'an, Wuxi, China

Abstract

Spectral response is one of the important technological parameters of the detector, along with the development of the ultraviolet detector technology, accurate measurement of UV detector spectral responsivity is becoming more and more important. This paper analyzes the ultraviolet focal plane array relative spectral responsivity measurement principle, using the substitution method of measuring ultraviolet focal plane array detector relative spectral responsivity, and established a calibration device for relative spectral response of UV focal plane array. The relative spectral response of UV focal plane array device was obtained,can be seen from the curves, UV focal plane array device from 250 nm to 290 nm spectral response range, the peak response near 270 nm, Show that the array sun-blind characteristic of a device. The uncertainty of analysis results showed that UV focal plane array device relative spectral response measurement uncertainty of calibration device is about 3.6%, can meet the demand of high precision measurement.

Citation Download Citation

HongYuan Liu, ChengPing Ying, Hongchao Wang, Hengfei Wang, Xueshun Shi, Bin Wu, and Bin Jiang "UV focal plane array device relative spectral response measurement technology research", Proc. SPIE 10255, Selected Papers of the Chinese Society for Optical Engineering Conferences held October and November 2016, 102553E (8 March 2017); https://doi.org/10.1117/12.2267422

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