PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
An important task for remote sensing applications is the characterization of material properties, which can be accomplished by estimating physics-based parameters from optical scattering off a target’s surface. In this paper, a novel approach is described to generate parameter-based images by applying the modified polarimetric bidirectional reflectance distribution function (pBRDF) model to the polarimetric imaging measurements collected with the University of Arizona’s Ground Multiangle SpectroPolarimetric Imager (Ground-MSPI). Values for complex refractive index (η), slope variance roughness (σ2) and diffuse scattering coefficient (ρd) for each pixel are jointly estimated. Images consisting of the parameter values are generated by using the estimation results and optimized by contrast-ratio enhancement algorithms. The approach offers significant potential for remote targets analysis and novel imaging technology development.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Hanyu Zhan, Hanwan Jiang, David G. Voelz, Meredith K. Kupinski, "Surface parameter based image estimation from application of a scattering model to polarized light measurements," Proc. SPIE 10407, Polarization Science and Remote Sensing VIII, 104070U (30 August 2017); https://doi.org/10.1117/12.2274972