Paper
22 March 2019 Accuracy and precision in estimating noise power spectrum in radiography imaging
Eunae Lee, Dong Sik Kim
Author Affiliations +
Proceedings Volume 11049, International Workshop on Advanced Image Technology (IWAIT) 2019; 110491Z (2019) https://doi.org/10.1117/12.2521620
Event: 2019 Joint International Workshop on Advanced Image Technology (IWAIT) and International Forum on Medical Imaging in Asia (IFMIA), 2019, Singapore, Singapore
Abstract
In order to observe the noise property of the radiography image detector, the noise power spectrum (NPS) is usually measured. NPS curve can be measured from the average of the periodogram samples. Here, we can improve the measurement accuracy and precision by increasing the number of periodogram samples and spectral resolution. In this paper, we observe the accuracy and precision of the NPS measurement, which is based on the periodograms. For real digital X-ray images, which were acquired from an indirect CsI(Tl)-scintillator radiography detector, we observed the accuracy and precision of the NPS estimates for various resolutions and sample sizes. For a given image size, we could find an appropriate combination of the sample size and spectral resolution from minimizing the mean square error.
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Eunae Lee and Dong Sik Kim "Accuracy and precision in estimating noise power spectrum in radiography imaging", Proc. SPIE 11049, International Workshop on Advanced Image Technology (IWAIT) 2019, 110491Z (22 March 2019); https://doi.org/10.1117/12.2521620
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KEYWORDS
Radiography

Sensors

Spectral resolution

Statistical analysis

X-ray imaging

X-rays

Fourier transforms

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