First commissioning results of the KB mirrors at the SCS instrument of the European XFEL

G. Mercurio; C. Broers; R. Carley; J. T. Delitz; N. Gerasimova; L. Le Guyarder; L. Mercadier; A. Reich; J. Schlappa; M. Teichmann; A. Yaroslavtsev; M. Cascella; K. Setoodehnia; M. Schneider; B. Pfau; S. Eisebitt; V. Vozda; V. Hájková; L. Vyšín; T. Burian; J. Chalupský; L. Juha; S. G. Alcock; I. Nistea; D. La Civita; H. Sinn; M. Vannoni; A. Scherz

doi:10.1117/12.2530725

9 September 2019 First commissioning results of the KB mirrors at the SCS instrument of the European XFEL

G. Mercurio, C. Broers, R. Carley, J. T. Delitz, N. Gerasimova, L. Le Guyarder, L. Mercadier, A. Reich, J. Schlappa, M. Teichmann, A. Yaroslavtsev, M. Cascella, K. Setoodehnia, M. Schneider, B. Pfau, S. Eisebitt, V. Vozda, V. Hájková, L. Vyšín, T. Burian, J. Chalupský, L. Juha, S. G. Alcock, I. Nistea, D. La Civita, H. Sinn, M. Vannoni, A. Scherz

Author Affiliations +

Proceedings Volume 11109, Advances in Metrology for X-Ray and EUV Optics VIII; 111090F (2019) https://doi.org/10.1117/12.2530725
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

The Spectroscopy and Coherent Scattering (SCS) instrument of the European XFEL is a soft X-ray beamline aiming to unravel electronic, spin and structural properties of materials in ultrafast processes at the nanoscale. Various experimental techniques offered at SCS have different requirements in terms of beam size at the sample. Kirkpatrick-Baez (KB) refocusing optics equipped with mechanical benders allows for independent change of the horizontal and vertical beam size. We report here on the first characterization of the SCS KB mirrors by means of a novel diffraction-based technique which images the beam profile on a 2D pixelated detector. This approach provides a quick characterization of micrometer beam sizes. Results are compared with metrology measurements obtained with a non-contact slope profiler.

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G. Mercurio, C. Broers, R. Carley, J. T. Delitz, N. Gerasimova, L. Le Guyarder, L. Mercadier, A. Reich, J. Schlappa, M. Teichmann, A. Yaroslavtsev, M. Cascella, K. Setoodehnia, M. Schneider, B. Pfau, S. Eisebitt, V. Vozda, V. Hájková, L. Vyšín, T. Burian, J. Chalupský, L. Juha, S. G. Alcock, I. Nistea, D. La Civita, H. Sinn, M. Vannoni, and A. Scherz "First commissioning results of the KB mirrors at the SCS instrument of the European XFEL", Proc. SPIE 11109, Advances in Metrology for X-Ray and EUV Optics VIII, 111090F (9 September 2019); https://doi.org/10.1117/12.2530725

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KEYWORDS

Mirrors

X-rays

Free electron lasers

Sensors

Computer programming

Diffraction gratings

Scattering

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