Paper
27 November 1989 X-Ray Characteristics Of CCD's for the XMM Reflection Grating Spectrometer (RGS)
Fred A. Jansen, Marc Heppener, Henry J.M. Aarts, Piet A.J. de Korte
Author Affiliations +
Abstract
The Reflection Grating Spectrometer (RGS) experiment on the X-ray Multi-Mirror (XMM) spacecraft will consist of two identical medium resolution ( ~100 - 560) reflection grating spectrometers operating in the 5-35 Å range.1 The dispersed X-ray beam will be detected by an array of 10 CCD's (nine for spectroscopy, one for wavelength and alignment calibration). This paper describes the requirements set upon CCD performance by this experiment as well as the first results obtained with a special test setup which has been designed as to allow optimum flexibility in changing all CCD parameters (clock sequences, slopes, bias voltages etc.) under software control.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Fred A. Jansen, Marc Heppener, Henry J.M. Aarts, and Piet A.J. de Korte "X-Ray Characteristics Of CCD's for the XMM Reflection Grating Spectrometer (RGS)", Proc. SPIE 1159, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy and Atomic Physics, (27 November 1989); https://doi.org/10.1117/12.962570
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Cited by 1 scholarly publication.
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KEYWORDS
Charge-coupled devices

Roentgenium

Spectroscopy

X-rays

X-ray astronomy

Electrodes

Back illuminated sensors

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