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5 March 2021 Inertial sensing with point-source atom interferometry for interferograms with less than one fringe
Yun-Jhih Chen, Azure Hansen, Moshe Shuker, Rodolphe Boudot, John Kitching, Elizabeth Donley
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Proceedings Volume 11700, Optical and Quantum Sensing and Precision Metrology; 1170009 (2021) https://doi.org/10.1117/12.2586900
Event: SPIE OPTO, 2021, Online Only
Abstract
Point source atom interferometry (PSI) is an atom-optical method that measures one axis of acceleration and two axes of rotation from atom-interferometric fringe images. The number of fringes in an image can be less than or larger than one, depending on the system rotation rate and the atom interferometer's sensitivity setting. Previously used methods for analyzing the fringes, such as parametric fittings, are not suitable for a wide range of rotation rates. We introduce a new experimental method that is effective in either case. Our approach does not require prior knowledge of fringe contrast, orientation, frequency, and phase.
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Yun-Jhih Chen, Azure Hansen, Moshe Shuker, Rodolphe Boudot, John Kitching, and Elizabeth Donley "Inertial sensing with point-source atom interferometry for interferograms with less than one fringe", Proc. SPIE 11700, Optical and Quantum Sensing and Precision Metrology, 1170009 (5 March 2021); https://doi.org/10.1117/12.2586900
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KEYWORDS
Chemical species
Interferometry
Clouds
Phase interferometry
Phase measurement
Raman spectroscopy
Laser interferometry
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