Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 12137, including the Title Page, Copyright information, Table of Contents, and Conference Committee listings.

The papers in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. Additional papers and presentation recordings may be available online in the SPIE Digital Library at SPIEDigitalLibrary.org.

The papers reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from these proceedings:

Author(s), “Title of Paper,” in Optics and Photonics for Advanced Dimensional Metrology II, edited by Peter J. de Groot, Richard K. Leach, Pascal Picart, Proc. of SPIE 12137, Seven-digit Article CID Number (DD/MM/YYYY); (DOI URL).

ISSN: 0277-786X

ISSN: 1996-756X (electronic)

ISBN: 9781510651500

ISBN: 9781510651517 (electronic)

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Paper Numbering: A unique citation identifier (CID) number is assigned to each article in the Proceedings of SPIE at the time of publication. Utilization of CIDs allows articles to be fully citable as soon as they are published online, and connects the same identifier to all online and print versions of the publication. SPIE uses a seven-digit CID article numbering system structured as follows:

  • The first five digits correspond to the SPIE volume number.

  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc. The CID Number appears on each page of the manuscript.

Conference Committee

Symposium Chairs

  • Francis Berghmans, Vrijie Universiteit Brussel (Belgium)

  • Thierry Georges, Oxxius SA (France)

  • Paul C. Montgomery, Université de Strasbourg (France)

Programme Track Chair

  • Francis Berghmans, Vrije Universiteit Brussel (Belgium)

Conference Chairs

  • Peter J. de Groot, Zygo Corporation (United States)

  • Richard K. Leach, The University of Nottingham (United Kingdom)

  • Pascal Picart, Laboratoire d’Acoustique de l’Université du Maine (France)

Conference Program Committee

  • Jürgen W. Czarske, Technische Universität Dresden (Germany)

  • Fengzhou Fang, Tianjin University (China)

  • Pietro Ferraro, Istituto Nazionale di Ottica (Italy)

  • Cosme Furlong, Worcester Polytechnic Institute (United States)

  • Yoshio Hayasaki, Utsunomiya University (Japan)

  • Michal Józwik, Warsaw University of Technology (Poland)

  • Dae Wook Kim, College of Optical Sciences, The University of Arizona (United States)

  • Peter H. Lehmann, Universität Kassel (Germany)

  • Paul C. Montgomery, Université de Strasbourg (France)

  • Andreas Ostendorf, Ruhr-Universität Bochum (Germany)

  • Yukitoshi Otani, Utsunomiya University (Japan)

  • Heidi Ottevaere, Vrijie Universiteit Brussel (Belgium)

  • Nicolas Passilly, FEMTO-ST (France)

  • Gabriel Popescu, University of Illinois (United States)

  • Christof Pruss, Universität Stuttgart (Germany)

  • Guohai Situ, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)

  • Rong Su, The University of Nottingham (United Kingdom)

  • Jean-François Vandenrijt, Center Spatial de Liège (Belgium)

  • Xiaocong Yuan, Nankai University (China)

© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 12137", Proc. SPIE 12137, Optics and Photonics for Advanced Dimensional Metrology II, 1213701 (31 May 2022); https://doi.org/10.1117/12.2642962
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KEYWORDS
Digital holography

Freeform optics

Adaptive optics

Geometrical optics

Integrated optics

Photonics

Metrology

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