Progress in demonstrating picometer class laser metrology using photonics integrated gauges

Jacob Wirth; James Mason; Alison Nordt

doi:10.1117/12.2630776

27 August 2022 Progress in demonstrating picometer class laser metrology using photonics integrated gauges

Jacob Wirth, James Mason, Alison Nordt

Proceedings Volume 12180, Space Telescopes and Instrumentation 2022: Optical, Infrared, and Millimeter Wave; 121805X (2022) https://doi.org/10.1117/12.2630776
Event: SPIE Astronomical Telescopes + Instrumentation, 2022, Montréal, Québec, Canada

Conference Poster

Abstract

Future large space telescope missions demand extreme stability to enable high contrast coronagraphy for exoplanet observation. The wavefront control systems needed to achieve and maintain the required wavefront quality of the imaging system requires high-performance metrology sensors capable of picometer class sensitivity over long duration exposures, as well as for ground-based verification of build performance. For nearly two decades, Lockheed Martin has invested in developing laser metrology gauge technologies implemented in Photonic Integrated Circuits (PICs). We describe a high precision displacement metrology system currently under development and in test which has a path to flight for these future systems. Recent implementations have demonstrated picometer-class sensitivity at high (< 1 Hz) frequencies using largely commercial-off-the-shelf hardware. The current work aims to improve performance at longer timescales.

Citation Download Citation

Jacob Wirth, James Mason, and Alison Nordt "Progress in demonstrating picometer class laser metrology using photonics integrated gauges", Proc. SPIE 12180, Space Telescopes and Instrumentation 2022: Optical, Infrared, and Millimeter Wave, 121805X (27 August 2022); https://doi.org/10.1117/12.2630776

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